Optical Techniques for Deformation, Structure and Shape Evaluation :: Special Issue

About This Special Issue

There has been a growing demand for non-destructive quantitate evaluations with the development of materials science and integration technology. Optical technology shows its unique superiority in performance evaluations of materials and structures owing to the non-contact characteristic. This special issue welcomes research and review papers related to optical techniques and apparatus for non-destructive evaluations of deformation, structure and shape. We are particularly interested in new optical methods, developed optical instruments, typical applications in the fields of materials science, aerospace, electronics, biology, medical science, oceanography and other industrial areas.

Expected topics include, but not limited to:

1) Optical methods and apparatus, such as laser interference, moiré methods, the digital image correlation method, electronic speckle pattern interferometry, the grid method, geometric phase analysis, holographic interferometry, holo-photoelasticity, etc.

2) Fabrication techniques deformation carriers, including regular patterns (grating, grid) and random patterns (speckle) at different scales

3) Measurement accuracy improvement techniques, such as phase shifting, image processing, using ultraviolet light or X-ray, etc.

4) Measurement in unconventional environments, such as micro/nano scales, high temperature, dynamic state, vibration, curved surface, three dimensions, etc.

5) Applications in deformation measurement, mechanical properties evaluation, structure characterization, shape measurement, defect detection, surface flatness assessment, interfacial bonding strength estimation of various materials and structures.

Lead Guest Editor

Qinghua Wang

Research Institute of Instrumentation Frontier, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan

Guest Editors

Yanjie Li

School of Civil Engineering and Architecture, University of Jinan, China
George Jandieri

Special Department, Georgian Technical University, Tbilisi, Georgia

Published Articles

Deformation Measurement Method Using Moiré Fringes at High Scanning Speed Under a Laser Scanning Microscope

Qinghua Wang , Shien Ri , Hiroshi Tsuda , Takashi Tokizaki

Issue: Volume 4, Issue 3-1, June 2015

Pages: 43-49

Received: 31 March 2015

Accepted: 31 March 2015

Published: 14 March 2016

DOI: 10.11648/j.optics.s.2015040301.20

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Abstract: A full-field deformation measurement method using moiré fringes generated at high scanning speed under a laser scanning microscope (LSM) was proposed. The formation principle and the deformation measurement principle were presented. Simulation and experiment verifications were performed to show the effectiveness and the accuracy of the proposed fas... Show More

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Fabrication of Micro-Scale Speckles with Particle Dispersion Method

He Guanglong , Zhu Jianguo

Issue: Volume 4, Issue 3-1, June 2015

Pages: 39-42

Received: 12 March 2015

Accepted: 8 June 2015

Published: 20 January 2016

DOI: 10.11648/j.optics.s.2015040301.19

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Abstract: Micro-scale speckles with particle dispersion method are fabricated as the deformation carriers in the digital image correlation method. Micro-scale carbon particles are mixed with epoxy resin proportionally, followed by solidifying, centrifugal and spinning. In the end, a speckle film can be fabricated, which can be transferred to the surface of s... Show More

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Residual Stress Measurement in Si-based Multilayer Structure by Micro-Raman Spectroscopy

Wei Qiu , CuiLi Cheng , Yu Cheng Zhao , Qiu Li

Issue: Volume 4, Issue 3-1, June 2015

Pages: 33-38

Received: 20 March 2015

Accepted: 8 July 2015

Published: 29 November 2015

DOI: 10.11648/j.optics.s.2015040301.18

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Abstract: Si-based multilayer structures, such as porous silicon (PS) and germanium silicon (ε-Si), are widely used in current microelectronics and Micro-electromechanical Systems (MEMS). During the preparing process of Si-based multilayer structures, some inhomogeneous residual stress is induced, maybe finally leading to structure failure. Micro-Ram... Show More

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Residual Stress Measurement in Micro-region Using Digital Image Correlation Method

Yanjie Li , Guang Han

Issue: Volume 4, Issue 3-1, June 2015

Pages: 29-32

Received: 29 March 2015

Accepted: 15 July 2015

Published: 2 September 2015

DOI: 10.11648/j.optics.s.2015040301.17

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Abstract: The residual stress of the zirconia film on a stainless steel substrate is measured using the digital image correlation (DIC) method. A lattice structure is milled by focused ion beam (FIB) and used as the deformation carrier. An annular groove is etched by FIB in order to release the residual stress. The DIC method is used to calculate the deforma... Show More

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Virtually and Depth Sensor Generated Moire Pictures in Screening and Treatment of Scoliosis

Akos Antal , Attila Katona , Peter Major , Jozsef Molnar , Norbert Szakaly , Peter Tamás , Klara Wenzel

Issue: Volume 4, Issue 3-1, June 2015

Pages: 24-28

Received: 30 March 2015

Accepted: 26 July 2015

Published: 7 August 2015

DOI: 10.11648/j.optics.s.2015040301.16

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Abstract: In this paper, different moiré picture generation techniques are presented. This paper presents the basics of moiré effects, a virtual way of moiré generation, depth sensor based moiré picture generation and usage. One of the most common advantages of these methods is rapidity. The computer generated moiré pictures provide an opportunity of screeni... Show More

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Calibration of a Fringe Projection 3D Measurement System Using an Equi-Phase Coordinate Method Based on Two-Reference-Plane

Dai Meiling , Yang Fujun , He Xiaoyuan

Issue: Volume 4, Issue 3-1, June 2015

Pages: 18-23

Received: 23 March 2015

Accepted: 25 March 2015

Published: 28 July 2015

DOI: 10.11648/j.optics.s.2015040301.15

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Abstract: Calibration is to transform the 2D phase information to the world coordinates in a fringe projection 3D measurement system. For the phase-to-height conversion, an equi-phase coordinate method based on two-reference-plane is proposed in this paper. The surface height is calculated by a linear interpolation using the coordinates where have the identi... Show More

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Measurement of Distortion Using the Moire Interferometry

K. Wenzel , Gy. Abraham , P. Tamas , A. Urbin

Issue: Volume 4, Issue 3-1, June 2015

Pages: 14-17

Received: 30 March 2015

Accepted: 12 July 2015

Published: 25 July 2015

DOI: 10.11648/j.optics.s.2015040301.14

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Abstract: Image forming lens systemsdo not provide perfect images. Lens abberations can be detected with complex optical ray-tracing. A single aberration in lenses, the distortion, can be detected at the image plane with optical mapping. Therefore moiré interferometry can be adapted to detect and measure distortion. This method is adaptable by serial testing... Show More

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Full-Field Displacement Measurement Technique by Using Repeated Patterns and JPEG Compressed Images

Shien Ri , Satoshi Hayashi , Hiroshi Tsuda , Shinji Ogihara

Issue: Volume 4, Issue 3-1, June 2015

Pages: 9-13

Received: 27 March 2015

Accepted: 26 June 2015

Published: 6 July 2015

DOI: 10.11648/j.optics.s.2015040301.13

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Abstract: This paper presents an experimental technique for measuring displacement distribution from an image of repeated patterns and JPEG compressed images. The measurement accuracy of the developed method is insusceptible to the degree of JPEG compression because only lower spatial frequency components of the repeated pattern are used to calculate the dis... Show More

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Fabrication of Micro-grating Structure by Nanosecond Laser

Yanlong Huang , Jianguo Zhu

Issue: Volume 4, Issue 3-1, June 2015

Pages: 5-8

Received: 23 February 2015

Accepted: 30 March 2015

Published: 12 May 2015

DOI: 10.11648/j.optics.s.2015040301.12

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Abstract: The fabrication method by nanosecond laser technology for micro-grating is investigated in this paper. A nanosecond laser system is established and the mechanism of laser processing on material surface is theoretically analyzed. The damage threshold of stainless steel is obtained experimentally when the nanosecond laser irradiates on the specimen’s... Show More

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Residual Stress Measurement of an Interference Fit Specimen Based on Moiré Interferometry and Hole-Drilling Method

Baoge Zhang , Jianguo Zhu

Issue: Volume 4, Issue 3-1, June 2015

Pages: 1-4

Received: 16 February 2015

Accepted: 23 March 2015

Published: 12 May 2015

DOI: 10.11648/j.optics.s.2015040301.11

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Abstract: In this paper, moiré interferometry is combined with hole-drilling method to measure the residual stress of an interference fit specimen. And, finite element method is used to calibrate the coefficient of hole-drilling method. The experimental results are consistent with theoretical results, which manifests that moiré interferometry combined with h... Show More

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